- Title
- Overall Automatic-optical-inspection efficiency (OAE) for Yield Enhancement in CMOS Image Sensor Manufacturing
- Creators - without role
- Y.-J. ChenC.-A. RongK.-H. ChangChen-Fu Chien - 國立清華大學工學院工業工程與工程管理學系
- Publication Details
- Proceedings of 15th Asia Pacific Industrial Engineering & Management Systems Conference (APIEMS2014) Proceedings of 15th Asia Pacific Industrial Engineering & Management Systems Conference (APIEMS2014)
- Identifiers
- 9957774203006774
- Academic Unit
- Department of Industrial Engineering and Engineering Management, College of Engineering, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
Overall Automatic-optical-inspection efficiency (OAE) for Yield Enhancement in CMOS Image Sensor Manufacturing
Proceedings of 15th Asia Pacific Industrial Engineering & Management Systems Conference (APIEMS2014) Proceedings of 15th Asia Pacific Industrial Engineering & Management Systems Conference (APIEMS2014)
2014
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