Overview and Future Challenge of Hafnium Oxide ReRAM

Conference paper

Y. S. Chen, H. Y. Lee, P. S. Chen, P. Y. Gu, Y. Y. Hsu, W. H. Liu, C. H. Tsai, S. M. Wang, S. S. Sheu, P. C. Chiang, …

International Conference on Solid-State Devices and Materials (2010 SSDM), p.1106

2010

Abstract

Hafnium Oxide ReRAM

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Title: Overview and Future Challenge of Hafnium Oxide ReRAM
Creators - without role: Y. S. Chen
H. Y. Lee
P. S. Chen
P. Y. Gu
Y. Y. Hsu
W. H. Liu
C. H. Tsai
S. M. Wang
S. S. Sheu
P. C. Chiang
W. P. Lin
W. S. Chen
F. T. Chen
C. H. Lien - 國立清華大學電機資訊學院電機工程學系
M. J. Tsai
Publication Details: International Conference on Solid-State Devices and Materials (2010 SSDM), p.1106
Identifiers: 9957773735106774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper