- Title
- PBT and NBT stresses-induced trap generation on nMOSFETs with HfO2/LaOx dielectric stacks
- Creators - without role
- Chun-Chang LuKuei-Shu Chang-Liao - 國立清華大學原子科學院工程與系統科學系Yu-Fen ChengYu-An ChangTien-Ko Wang
- Identifiers
- 9957777030406774
- Academic Unit
- Institute of Nuclear Engineering and Science, College of Nuclear Science, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
PBT and NBT stresses-induced trap generation on nMOSFETs with HfO2/LaOx dielectric stacks
2009
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