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Packaging Reliability Estimation of High-Power Device Modules by Utilizing Silver Sintering Technology
Conference paper

Packaging Reliability Estimation of High-Power Device Modules by Utilizing Silver Sintering Technology

昌駿 李
The 31st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2020)
10/2020

Abstract

Utilizing Silver Sintering Technology

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