- Title
- Patent Quality Estimation Using Machine Learning – An Industrial Internet of Things Empirical Study
- Creators - without role
- 瑞芬 張C.V. TrappeyU.H. GovindarajanJ.H. Sun
- Publication Details
- 2018 International Symposium on Semiconductor Manufacturing Intelligence & 2018 IEEE International Conference on Smart Manufacturing, Industrial & Logistics Engineering
- Identifiers
- 9957775841906774
- Academic Unit
- Department of Industrial Engineering and Engineering Management, College of Engineering, National Tsing Hua University
- Language
- English
- Resource Type
- Conference paper
Conference paper
Patent Quality Estimation Using Machine Learning – An Industrial Internet of Things Empirical Study
2018 International Symposium on Semiconductor Manufacturing Intelligence & 2018 IEEE International Conference on Smart Manufacturing, Industrial & Logistics Engineering
2018
Related links
Metrics
1 Record Views