- Title
- Pattern Integrity Judgment Methodology for Inkjet Printed Electronics
- Creators - without role
- Hui-Ju ChanChia-Che ChenJian-Wei HongCheng-Yao Lo - 國立清華大學工學院動力機械工程學系
- Publication Details
- The 40th International Conference on Micro and NanoEngineering The 40th International Conference on Micro and NanoEngineering
- Identifiers
- 9957766262706774
- Academic Unit
- Institute of NanoEngineering and Microsystems, College of Engineering, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
Pattern Integrity Judgment Methodology for Inkjet Printed Electronics
The 40th International Conference on Micro and NanoEngineering The 40th International Conference on Micro and NanoEngineering
2014
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