Abstract
Using inkjet printing as a patterning technique for electronic circuits, compare to photolithography, has advantages of low cost, less consumable, faster prototyping, and simplicity. In order to ensure correct circuit functionalities, pattern quality of circuits was repeatedly evaluated quantitatively and qualitatively in various photolithography steps. However, although many researchers have demonstrated inkjet printed submicrometer line and space, pattern perfection was never evaluated properly. Our previous work proposed a quantitative evaluation methodology to judge the quality of straight lines, bending corners, and Archimedean spiral, which were either linear or arithmetic-progression (AP) patterns. In this work, we propose an advanced methodology to be effective also for non-AP patterns such as logarithmic, hyperbolic,and lituus spirals. This advanced methodology prevails the previous one by supporting both AP and nonAP patterns. Limitations and effectiveness of this methodology were also studied.