Performance Investigation of a Nanoscale Strained Ge PMOSFETs with a Ge-Sn Alloy Stressor

Conference paper

C. C. Lee, S. T. Chang, S. W. Cheng and B. T. Chian

12th International Nanotech Symposium & Exhibition (NANO KOREA 2014) 12th International Nanotech Symposium & Exhibition (NANO KOREA 2014)

2014

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Title: Performance Investigation of a Nanoscale Strained Ge PMOSFETs with a Ge-Sn Alloy Stressor
Creators - without role: C. C. Lee - 國立清華大學工學院動力機械工程學系
S. T. Chang
S. W. Cheng
B. T. Chian
Publication Details: 12th International Nanotech Symposium & Exhibition (NANO KOREA 2014) 12th International Nanotech Symposium & Exhibition (NANO KOREA 2014)
Identifiers: 9957773441406774
Academic Unit: Department of Power Mechanical Engineering, College of Engineering, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper