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Phase Evolution and Diffusion Path in the Flip Chip Sn-3.0Ag-(0.5 or 1.5)Cu Solder Bump during Aging
Conference paper

Phase Evolution and Diffusion Path in the Flip Chip Sn-3.0Ag-(0.5 or 1.5)Cu Solder Bump during Aging

G.Y. Jang, J.G. Duh, S.W. Lu and J.C. Chen
Materials Science & Technology 2005 conference and Exhibition Materials Science & Technology 2005 conference and Exhibition
2005

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