Logo image
Phenomenon of nMOSFETs with CESL Stressor for Different Channel Lengths
Conference paper

Phenomenon of nMOSFETs with CESL Stressor for Different Channel Lengths

H. W. Hsu, H. S. Huang, C. C. Lee, S. Y. Chen, H. H. Teng, M. H. Hung, M. R. Peng, M. C. Wang and C. H. Liu
6th International Conference on Technological Advances of Thin Films & Surface Coatings (ThinFilms2012) 6th International Conference on Technological Advances of Thin Films & Surface Coatings (ThinFilms2012)
2012

Metrics

1 Record Views

Details

Logo image