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Precision measurement of the charged pion mass by high resolution X-ray spectroscopy
Conference paper

Precision measurement of the charged pion mass by high resolution X-ray spectroscopy

G.L. Borchert, B. Manil, D. Anagnostopoulos, J.P. Egger, D. Gotta, M. Hennebach, P. Indelicato, Y.W. Liu, Y.W. Liu, N. Nelms, …
Hyperfine Interactions, Vol.132(1-4), pp.195-207
2001
Appears in  keyword about Physics

Abstract

Bragg spectrometer Charged pion mass Exotic atom X-ray spectroscopy Atomic and Molecular Physics and Optics Nuclear and High Energy Physics Condensed Matter Physics Physical and Theoretical Chemistry
A new experiment for a high-precision measurement of the pion mass at a 1 ppm level is presented. It combines an improved cyclotron trap that produces pionic and muonic atoms in a small volume with a doubly focusing crystal spectrometer to measure the corresponding exotic X-ray transitions with high accuracy and a novel type of CCD detector. The muonic X-rays lines serve as highly accurate calibration lines. The measurement has been accomplished recently. A detailed analysis of the data is on the way.

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