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Process and Structure Considerations for the Post FinFET Era
Conference paper

Process and Structure Considerations for the Post FinFET Era

Chun-Jung Su, Po-Jung Sung, Kuo-Hsing Kao, Yao-Jen Lee, Wen-Fa Wu and Wen-Kuan Yeh
2020 IEEE Silicon Nanoelectronics Workshop, SNW 2020, pp.13-14
06/2020

Abstract

CMOS FinFET nanosheet nanowire Hardware and Architecture Electrical and Electronic Engineering Electronic Optical and Magnetic Materials
Evolution of transistor structures, from planar, fin to gate-all-around (GAA) nanowire (NW)/nanosheet (NS), enables consecutive device scaling and performance boost. To further enhance the drive current per footprint, a vertically stacked configuration compatible with current CMOS technology may be a promising approach for extending Moore's Law. In this paper, we review the recent status of stacked FET architectures and beyond, as well as pointing out the challenges and perspectives.

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