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Protruding Design Effect of Poly Gate on Nanoscale NMOSFETs with Advanced Strain Engineering
Conference paper

Protruding Design Effect of Poly Gate on Nanoscale NMOSFETs with Advanced Strain Engineering

C. C. Lee, C. H. Liu and H. H. Teng
6th International Conference on Technological Advances of Thin Films & Surface Coatings (ThinFilms2012) 6th International Conference on Technological Advances of Thin Films & Surface Coatings (ThinFilms2012)
2012

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