Quantitative Characterization of Low-Temperature-Grown GaAs by Transient Photoreflectance Measurement

Conference paper

Jian-Shen Yu, Sheng-fu Horng and C. C. Chi

Int. Electron. Devices and Mater. Symposia

1996

Abstract

Low-Temperature-Grown;GaAs;Photoreflectance

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Title: Quantitative Characterization of Low-Temperature-Grown GaAs by Transient Photoreflectance Measurement
Creators - without role: Jian-Shen Yu
Sheng-fu Horng - 國立清華大學電機資訊學院電機工程學系
C. C. Chi
Publication Details: Int. Electron. Devices and Mater. Symposia
Identifiers: 9957771725306774
Academic Unit: Institute of Electronics Engineering, College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper