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Reachability analysis of sequential circuits
Conference paper

Reachability analysis of sequential circuits

Jung-Tai Tsai, Chun-Yao Wang and Kuang-Jung Chang
Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010, pp.181-184
2010

Abstract

Reachability analysis is a fundamental technique in the synthesis, verification of VLSI circuits. This paper presents a novel semi-formal approach which combines the advantages of simulation and formal methods to traverse the state space of the FSMs. We conduct the experiments on a set of ISCAS'89 benchmarks. Compared with a previous work which relies on biased random technique, our approach reaches more states with less CPU time. ©2010 IEEE.

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