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Reactions of the (Ag,Cu) Braze with the Ni Substrate in the Microelectronic Joining Processes
Conference paper

Reactions of the (Ag,Cu) Braze with the Ni Substrate in the Microelectronic Joining Processes

S.-W. Chen and H.-T. Luo
The 123th TMS Annual Meeting & Exhibition(1994) 123th TMS Annual Meeting
1994

Abstract

Ag;Cu;Braze;Ni;Microelectronic Joining Processes

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