Real-Time Measurement of Stress-Induced Interface Trap with Stress-and-Sense Charge Pumping

Conference paper

Chun-Chang Lu, Kuei-Shu Chang-Liao, Fu-Huan Tsai, Tien-Ko Wang, Hsueh-Chao Ko and Yao-Tung Hsu

CSTIC 2013 CSTIC 2013

2013

Abstract

Real-Time Measurement;Stress-Induced Interface Trap;Stress-and-Sense Charge Pumping

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Title: Real-Time Measurement of Stress-Induced Interface Trap with Stress-and-Sense Charge Pumping
Creators - without role: Chun-Chang Lu
Kuei-Shu Chang-Liao - 國立清華大學原子科學院工程與系統科學系
Fu-Huan Tsai
Tien-Ko Wang
Hsueh-Chao Ko
Yao-Tung Hsu
Identifiers: 9957777337906774
Academic Unit: Institute of Nuclear Engineering and Science, College of Nuclear Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper
Publication Details: CSTIC 2013 CSTIC 2013