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Redistributed Geometrical Effect of Cu-Filled Stacked Vias on the Thermal-Induced Stress and Warpage of 3D-ICs Embedded Interposer
Conference paper

Redistributed Geometrical Effect of Cu-Filled Stacked Vias on the Thermal-Induced Stress and Warpage of 3D-ICs Embedded Interposer

C. C. Lee, J. Y. He and P. C. Huang
International Multi-Conference on Engineering and Technology Innovation 2017 (IMETI2017) International Multi-Conference on Engineering and Technology Innovation 2017 (IMETI2017)
2017

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