Reliability evaluation of voltage controlled oscillators based on a device degradation sub-circuit model

Wei-Cheng Lin; Long-Jei Du; Ya-Chin King

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Conference paper

Reliability evaluation of voltage controlled oscillators based on a device degradation sub-circuit model

Wei-Cheng Lin, Long-Jei Du and Ya-Chin King

IEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers, pp.377-380

2003

Abstract

This paper presents a method for circuit reliability evaluation. Based on the study of device reliability, a sub-circuit describing the device degradation after high-voltage stress is proposed. This model allows circuit reliability of VCOs to be evaluated and provides higher degree of freedom for circuit designers.

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Title: Reliability evaluation of voltage controlled oscillators based on a device degradation sub-circuit model
Creators - without role: Wei-Cheng Lin - Semiconduct. Technol. Applic. R.G. , Department of Electrical Engineering , National Tsing-Hua University
Long-Jei Du - Semiconduct. Technol. Applic. R.G. , Department of Electrical Engineering , National Tsing-Hua University
Ya-Chin King - Semiconduct. Technol. Applic. R.G. , Department of Electrical Engineering , National Tsing-Hua University
Publication Details: IEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers, pp.377-380
Grant note: IEEE
Identifiers: 9957768432606774
Academic Unit: Institute of Electronics Engineering, College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: English
Resource Type: Conference paper

Reliability evaluation of voltage controlled oscillators based on a device degradation sub-circuit model

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