Response analysis of optically modulated scatterer probes for electromagnetic-field measurement

Jimmy Chun-Ming Hsu; Ray-Rong Lao; Jeng Gong; Chih-Fang Huang

doi:10.1109/APMC.2009.5384360

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Conference paper

Response analysis of optically modulated scatterer probes for electromagnetic-field measurement

Jimmy Chun-Ming Hsu, Ray-Rong Lao, Jeng Gong and Chih-Fang Huang

APMC 2009 - Asia Pacific Microwave Conference 2009, pp.1617-1620

2009

DOI: https://doi.org/10.1109/APMC.2009.5384360

Abstract

Inetrdigital structure

Optically modulated scatterer (OMS)

Photoconductive switch

An analysis of the response of optically modulated scatterer (OMS) probes with a circular-interdigit structure photoconductive switch is presented. The theoretical analysis shows the response of OMS is determined by impedance of the photoconductive switch and antenna impedance of it. The calculations and measurements of these impedances and the relation between the impedance and response of OMS probe are reported. ©2009 IEEE.

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Title: Response analysis of optically modulated scatterer probes for electromagnetic-field measurement
Creators - without role: Jimmy Chun-Ming Hsu - Institute of Electronic Engineering , National Tsing Hua University
Ray-Rong Lao - National Tsing Hua University
Jeng Gong - Tunghai University
Chih-Fang Huang - Institute of Electronic Engineering , National Tsing Hua University
Publication Details: APMC 2009 - Asia Pacific Microwave Conference 2009, pp.1617-1620
Identifiers: 9781424428021; 9957768650606774
Academic Unit: Institute of Electronics Engineering, College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: English
Resource Type: Conference paper

Response analysis of optically modulated scatterer probes for electromagnetic-field measurement

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