Abstract
The magnetic, electrical and crystalline properties of epitaxial Fe 3 O 4 films grown by ion beam deposition was presented. The M s value of epitaxial films was found to be around 310 emu/cm 3 which was almost independent of thickness from 45 to 195 nm. The M s value of the polycrystalline films was also found to show significant thickness dependence, which could be attributed to the formation of the initial layer. Verwey transition at 110 K was also observed on 195 nm epitaxial films which decreased significantly with the decreasing thickness.