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SIMS and Raman studies of Mg-doped InN
Conference paper   Peer reviewed

SIMS and Raman studies of Mg-doped InN

V.Yu. Davydov, A.A. Klochikhin, M.B. Smirnov, Yu E. Kitaev, A.N. Smirnov, E.Y. Lundina, Hai Lu, William J. Schaff, H.-M. Lee, H.-W. Lin, …
Physica Status Solidi (C) Current Topics in Solid State Physics, Vol.5(6), pp.1648-1651
2008

Abstract

Raman and SIMS studies of Mg-doped InN films with a Mg content from N Mg = 3.3 × 10 19 to 5.5 × 10 21 cm -3 are reported. Lattice dynamics of hexagonal InN with substitutional impurities and vacancies has been investigated theoretically and calculated Raman spectra were compared with experimental ones. It is concluded that Raman spectroscopy is a good tool for quantitative characterization of Mg-doped InN. © 2008 Wiley-VCH Verlag GmbH & Co. KGaA.

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