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SPICE simulation model for field emission triode
Conference paper

SPICE simulation model for field emission triode

Chih-Wen Lu, Chung Len Lee and J.M. Huang
Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC, pp.62-66
1996

Abstract

Surfaces and Interfaces
In this work, a simple but accurate circuit model, which can be incorporated into circuit simulation programs such as SPICE, for field emission triode (FET) is developed. The model is based on the Fowler-Nordheim (F-N) J-E relationship but takes into account the charge distribution on the surface of the tip of the device. A procedure is also developed to extract the parameters of the model.

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