Scaling effects of the scaled charge trapping layer on SONOS type non-volatile memory

Conference paper

Scaling effects of the scaled charge trapping layer on SONOS type non-volatile memory

H. C. Lee, C. H. Shih, T. H. Wu, W. Chang, C. Lien and W. F. Wu

2009

Abstract

Scaling effects;SONOS type non-volatile memory

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Title: Scaling effects of the scaled charge trapping layer on SONOS type non-volatile memory
Creators - without role: H. C. Lee
C. H. Shih
T. H. Wu
W. Chang
C. Lien
W. F. Wu - 國立清華大學原子科學院工程與系統科學系
Identifiers: 9957768794406774
Academic Unit: Department of Engineering and System Science, College of Nuclear Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper