Scan-Resistant Charge-Sharing Fault in Domino Circuit

Conference paper

C.H. Cheng, J.S. Wang, S.C. Chang and W.B. Jone

Computer Society Annual Workshop on VLSI

2000

Abstract

Scan-Resistant;Charge-Sharing;Fault;Domino Circuit

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Title: Scan-Resistant Charge-Sharing Fault in Domino Circuit
Creators - without role: C.H. Cheng
J.S. Wang
S.C. Chang - 國立清華大學電機資訊學院資訊工程學系
W.B. Jone
Publication Details: Computer Society Annual Workshop on VLSI
Identifiers: 9957772378606774
Academic Unit: Department of Computer Science, College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper