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Self-Sufficient Clock Jitter Measurement Methodology Using Dithering-Based Calibration
Conference paper

Self-Sufficient Clock Jitter Measurement Methodology Using Dithering-Based Calibration

Yi-Hsuan Lee, Wei-Hao Chen and Shi-Yu Huang
Proceedings - 7th IEEE International Test Conference in Asia, ITC-Asia 2023
2023

Abstract

Calibration Jitter Measurement Peak-to-Peak Jitter Phase-Locked Loop Time-to-Digital Converter Hardware and Architecture Electrical and Electronic Engineering Safety Risk Reliability and Quality Control and Optimization
For a Phase-Locked Loop (PLL), the variation of its output clock cycle time known as clock jitter is an important performance metric. A complete online clock jitter measurement is often performed in two stages - quantization of the clock cycle times into digital codes, and calibration of the digital codes into absolute jitter information in pico-seconds. The latter stage could be challenging as it requires accurate training clock signals as references. In this article, we propose a dithering-based scheme to resolve this issue with ease. For a cell-based PLL using a 90nm CMOS process, the post-layout transistor-level simulation supports that this is a simple yet effective method.

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