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Signal Reduction of Signature Blocks for Transient Fault Debugging
會議論文

Signal Reduction of Signature Blocks for Transient Fault Debugging

Chun-Yeh Wang, Chien-Hsing Liang, Jing-Jia Liou 和 Harry H. Chen
Proceedings - Asian Test Symposium, 頁碼.1-6
IEEE
2023 IEEE 32nd Asian Test Symposium (ATS) (Beijing, China, 14/10/2023–17/10/2023)
14/10/2023
Web of Science ID: WOS:001108557200025

摘要

Benchmark testing Circuit faults Complexity theory Debugging Fault diagnosis Model checking Reliability Signature Blocks Soft Errors Transient analysis Transient Faults
Debugging is becoming increasingly important to identify functional errors of SoC caused by transient faults and to ensure system reliability. However, due to the complexity of a SoC, locating faulty signals and cycles can be challenging. Debugging flow and tool, e.g., EQED [1], applies signature blocks (MISR circuits) to capture errors and uses bounded model checking to identify transient fault candidates. In this paper, we proposed a reduction method to select essential signals for inserting and connecting signature blocks. The method identifies the propagation condition of faults and constructs a fault propagation graph (a tree of equivalent propagated faults) for the selection of essential transient faults. In our experiments of a RISC-V core, we can reduce the selected signals to about 2% on average, while maintaining more than 99% of debugging coverage.

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