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Simulation and Metrological Applications for RDL Patterning Development of Glass Substrate
Conference paper

Simulation and Metrological Applications for RDL Patterning Development of Glass Substrate

J.-C. Chuang, C.-T. Yang, C.-I.-I. Li, S.-H. Lee, 昌駿 李 and S.-H. Kuo
Proceedings - Electronic Components and Technology Conference, pp.990-995
2024

Abstract

Glass Substrate;Finite Element Analysis;Digital Optical Method

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