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Simulation and modeling of thermal effects in 4H-SiC NPN BJTs
Conference paper   Peer reviewed

Simulation and modeling of thermal effects in 4H-SiC NPN BJTs

Chih-Fang Huang and Chien-Yuen Tseng
Materials Science Forum, Vol.600-603, pp.1163-1166
2009

Abstract

4H-SiC Bipolar junction transistors Thermal effects
This paper presents a simulation study on the thermal effects in 4H-SiC NPN BJTs. Simulation results show several important effects on the BJT characteristics such as base contact locations, current gain reduction due to high level injection in the base at high current densities, and the non-uniform current distribution due to long fingers and poor contact resistance. A DC spice model with temperature effects is created. The IVs of the model are in good agreement with measurement. © (2009) Trans Tech Publications, Switzerland.

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