Abstract
<p><span style="font-size:10pt"><span style="text-justify:inter-ideograph"><span style="layout-grid-mode:char"><span style="font-family:"Times New Roman",serif"><i>A dynamic technique for estimating program testability was proposed and called propagation, infection, and execution (PIE) analysis. Previous research studies show that PIE analysis can effectively complement software testing. However, PIE technique requires a lot of computational overhead in estimating the testability of software components. In this paper, we propose an Extended PIE (EPIE) method to accelerate the traditional PIE analysis based on generating group testability as a substitute for location testability. The experimental results show that the number of analyzed locations can be decreased and the estimated value of testability does not lose too much precision.</i></span></span></span></span></p>