Spatial structure analysis for subsurface defect detection in materials using active infrared thermography and adaptive fixed-rank kriging

會議論文

Spatial structure analysis for subsurface defect detection in materials using active infrared thermography and adaptive fixed-rank kriging

Chun-Han Chang, Stefano Sfarra, Nan-Jung Hsu 和遠姚

Advanced Infrared Technology and Applications 2023 (AITA 2023)

Venice, Italy, 10/09/2023–13/09/2023

09/2023

摘要

active thermography;adaptive fixed-rank kriging;defect detection;thermographic data processing

相關連結

指標

1 檢視次數

詳細資料

題名: Spatial structure analysis for subsurface defect detection in materials using active infrared thermography and adaptive fixed-rank kriging
創作者：: Chun-Han Chang (作者)
Stefano Sfarra (作者)
Nan-Jung Hsu (作者)
遠姚 (作者)
會議: Venice, Italy, 10/09/2023–13/09/2023
學術資源類型: 會議論文
出版日期: 09/2023
出版資訊: Advanced Infrared Technology and Applications 2023 (AITA 2023)
語言: 英語