Logo image
Strain Engineering of Nanoscale Si PMOSFET Devices with SiGe Alloy Integrated with CESL Stressors
Conference paper

Strain Engineering of Nanoscale Si PMOSFET Devices with SiGe Alloy Integrated with CESL Stressors

C. C. Lee, S. T. Chang, C. C. Huang and C. Y. Li
9th International Nanotech Symposium & Exhibition (NANO KOREA 2011) 9th International Nanotech Symposium & Exhibition (NANO KOREA 2011)
2011

Metrics

1 Record Views

Details

Logo image