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Stress Analysis in Channel Region for nMOSFET Combining CESL Stressor and SiGe Channel
Conference paper

Stress Analysis in Channel Region for nMOSFET Combining CESL Stressor and SiGe Channel

H. W. Hsu, H. S. Huang, C. C. Lee, H. H. Teng, M. H. Hung, M. R. Peng, M. C. Wang, S. Y. Chen and C. H. Liu
International Conference on Automatic Control and Artificial Intelligence (ACAI 2012) International Conference on Automatic Control and Artificial Intelligence (ACAI 2012)
2012

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