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Stress-induced Failure Predictions of Flexible Electronics with Nano-Scaled Thin-Films
Conference paper

Stress-induced Failure Predictions of Flexible Electronics with Nano-Scaled Thin-Films

C. C. Lee and C. C. Huang
the 2014 Asian Conference on Nanoscience and Nanotechnology (AsiaNANO 2014) the 2014 Asian Conference on Nanoscience and Nanotechnology (AsiaNANO 2014)
2014

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