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Structural Optimizations of Silicon Based NMOSFETs with a Sunken STI Pattern by Using a Robust Stress Simulation Methodology
Conference paper

Structural Optimizations of Silicon Based NMOSFETs with a Sunken STI Pattern by Using a Robust Stress Simulation Methodology

C. C. Lee, C. H. Liu, R. H. Deng and Y. H. Lin
11th International Nanotech Symposium & Exhibition (NANO KOREA 2013) 11th International Nanotech Symposium & Exhibition (NANO KOREA 2013)
2013

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