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Study of Lamina Fracture of Cu/Low-k Interconnects Using the J-Integral Method
Conference paper

Study of Lamina Fracture of Cu/Low-k Interconnects Using the J-Integral Method

C. C. Chiu, C. C. Lee and K. N. Chiang
7th International Conference on Fracture and Strength of Solids (FEOFS 2007) 7th International Conference on Fracture and Strength of Solids (FEOFS 2007)
2007

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