- Title
- Succeeded Foundation Effect of Stretched Gate Width and Dummy Diffusion Region on Strained Silicon PMOSFETs
- Creators - without role
- C. C. Lee - 國立清華大學工學院動力機械工程學系C. P. Hsieh
- Publication Details
- TACT 2017 International Thin Films Conference TACT 2017 International Thin Films Conference
- Identifiers
- 9957776391806774
- Academic Unit
- Department of Power Mechanical Engineering, College of Engineering, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
Succeeded Foundation Effect of Stretched Gate Width and Dummy Diffusion Region on Strained Silicon PMOSFETs
TACT 2017 International Thin Films Conference TACT 2017 International Thin Films Conference
2017
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