Abstract
The Charge Sharing (CS) problem is one of notorious noise problems in domino circuits design and test. In this paper, this problem is thoroughly investigated by considering circuit topology and circuit function. The sensitivity of each domino gate to the CS problem is represented by the concept of CS-vulnerability. A method to derive the CS-vulnerability and the test pattern for each domino gate is suggested. We also propose a transistor reordering method to dramatically reduce the CS-vulnerabilities for all domino gates, so that the CS problem can be alleviated. Simulation results demonstrate that our transistor reordering method can efficiently reduce the CS-vulnerabilities for most of domino circuits.