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Test and diagnosis algorithm generation and evaluation for MRAM write disturbance fault
Conference paper

Test and diagnosis algorithm generation and evaluation for MRAM write disturbance fault

Wan-Yu Lo, Ching-Yi Chen, Chin-Lung Su and Cheng-Wen Wu
Proceedings of the Asian Test Symposium, pp.417-422
2008

Abstract

Electrical and Electronic Engineering
We proposed the systematic tools, RAMSES-M and TAGS-M, for test and diagnosis algorithms evaluation and development, respectively. In addition to traditional memoryfault models, the tools support the MRAM specific fault model, Write Disturbance Fault (WDF) and its specific test operation, Read-previous, which is proposed in this paper, too. The concept of Weighted Fault Coverage (WFC) is introduced and adopted by RAMSES-M. Several test and diagnosis algorithms generated by the proposed tool are compared with other conventional March algorithms. The results show that the proposed algorithms have better performance for testing and diagnosis. © 2008 IEEE.

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