Test and repair of non-volatile commodity and embedded memories (NAND flash memory)

Riichiro Shirota

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Conference paper

Test and repair of non-volatile commodity and embedded memories (NAND flash memory)

Riichiro Shirota

IEEE International Test Conference (TC), p.1221

2002

Abstract

Electrical and Electronic Engineering

Applied Mathematics

The test time of the memory chip is a very important issue. It depends on the program and erase time. NAND Flash memories perform high speed programming and erasing. Such devices perform accurately with the use of error chip collection (ECC) technology.

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Title: Test and repair of non-volatile commodity and embedded memories (NAND flash memory)
Translated title: Test and repair of non-volatile commodity and embedded memories (NAND flash memory)
Creators - without role: Riichiro Shirota - Toshiba Corporation , Semiconductor Company
Publication Details: IEEE International Test Conference (TC), p.1221
Identifiers: 9957776885106774
Academic Unit: College of Semiconductor Research, National Tsing Hua University
Language: English
Resource Type: Conference paper

Test and repair of non-volatile commodity and embedded memories (NAND flash memory)

Abstract

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