Test integration of core-based system-on-chip supporting delay test

Conference paper

Test integration of core-based system-on-chip supporting delay test

S.-M. Wang, C.-Y. Lo, C.-H. Wang and C.-W. Wu

Proc. 16th VLSI Design/CAD Symp.

2005

Abstract

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Title: Test integration of core-based system-on-chip supporting delay test
Creators - without role: S.-M. Wang
C.-Y. Lo
C.-H. Wang
C.-W. Wu - 國立清華大學電機資訊學院電機工程學系
Publication Details: Proc. 16th VLSI Design/CAD Symp.
Identifiers: 9957766975006774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper