Abstract
The test scheduling of memory cores can significantly affect the test time and power of system chips. We propose a test scheduling algorithm for BISTed memory cores to minimize the overall testing time under the test power constraint. The proposed algorithm combines several approaches for a near-optimal result, based on the properties of BISTed memory cores. By proper partitioning, an analytic exhaustive search finds optimal results for large memory cores, while a heuristic ordering with simulated annealing further handles a large amount of smaller memory cores. On the average, the results are within 1% difference of the optimal solution for the cases of 200 memory cores.