Test wrapper design automation for system-on-chip

Conference paper

Test wrapper design automation for system-on-chip

H.-J. Huang, J.-F. Li, J.-B. Chen, C.-P. Su, C.-W. Wu, C. Cheng, S.-I Chen, C.-Y. Hwang and H.-P. Lin

Proc. 12th VLSI Design/CAD Symp.

08/2001

Abstract

wrapper;automation;system-on-chip

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Title: Test wrapper design automation for system-on-chip
Creators - without role: H.-J. Huang
J.-F. Li
J.-B. Chen
C.-P. Su
C.-W. Wu
C. Cheng
S.-I Chen
C.-Y. Hwang
H.-P. Lin
Publication Details: Proc. 12th VLSI Design/CAD Symp.
Identifiers: 9957773848606774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper