Testing MRAM for write disturbance fault

Conference paper

Testing MRAM for write disturbance fault

W.-Y. Lo, C.-Y. Chen, C.-L. Su and C.-W. Wu

Proc. 18th VLSI Design/CAD Symp.

08/2007

Abstract

MRAM;disturbance

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Title: Testing MRAM for write disturbance fault
Creators - without role: W.-Y. Lo
C.-Y. Chen
C.-L. Su
C.-W. Wu
Identifiers: 9957775061606774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper
Publication Details: Proc. 18th VLSI Design/CAD Symp.