- Title
- Testing for 3D FPGA interconnect open and short faults
- Creators - without role
- Y.-L. PengC.-W. Wu - 國立清華大學電機資訊學院電機工程學系
- Publication Details
- Proc. 3rd VLSI Test Technology Workshop (VTTW)
- Identifiers
- 9957775737606774
- Academic Unit
- College of Electrical Engineering and Computer Science, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
Testing for 3D FPGA interconnect open and short faults
Proc. 3rd VLSI Test Technology Workshop (VTTW)
2009
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