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The Accompanied Effects of Process-Oriented and Temperature Cycling Loadings on the Warpage of Thin-Type 3D-ICs Packaging Structure and the Creep Behavior of Microjoints
Conference paper

The Accompanied Effects of Process-Oriented and Temperature Cycling Loadings on the Warpage of Thin-Type 3D-ICs Packaging Structure and the Creep Behavior of Microjoints

C. C. Lee, H.C.Liu and C. P. Hsieh
Proceedings of the 34th National Conference on Mechanical Engineering (CSME) Proceedings of the 34th National Conference on Mechanical Engineering (CSME)
2017

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