- Title
- The Development of Estimated Methodology for Interfacial Adhesion of Semiconductor Coatings Having an Enormous Mismatch Extent
- Creators - without role
- C. C. Lee - 國立清華大學工學院動力機械工程學系P. C. HuangC. W. Wang
- Publication Details
- 2nd International Conference on Applied Surface Science (ICASS) 2nd International Conference on Applied Surface Science (ICASS)
- Identifiers
- 9957772716206774
- Academic Unit
- Department of Power Mechanical Engineering, College of Engineering, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
Conference paper
The Development of Estimated Methodology for Interfacial Adhesion of Semiconductor Coatings Having an Enormous Mismatch Extent
2nd International Conference on Applied Surface Science (ICASS) 2nd International Conference on Applied Surface Science (ICASS)
2017
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