- Title
- The Qualitative Inquiry on the Relationship Betwen The Breakdown Voltage and LOCOS Dimensions For HIgh-Frequency High-Power Structureed MOS-Devices
- Creators - without role
- 建銘 陳清風 黃正 龔勝富 洪 - 國立清華大學電機資訊學院電機工程學系
- Identifiers
- 9957771965906774
- Academic Unit
- Institute of Electronics Engineering, College of Electrical Engineering and Computer Science, National Tsing Hua University
- Language
- Traditional Chinese
- Resource Type
- Conference paper
- Publication Details
- 1997 Electron. Devices and Mater. Symposia
Conference paper
The Qualitative Inquiry on the Relationship Betwen The Breakdown Voltage and LOCOS Dimensions For HIgh-Frequency High-Power Structureed MOS-Devices
1997 Electron. Devices and Mater. Symposia
1997
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