The economic models for a VLSI test strategy planning system

Conference paper

The economic models for a VLSI test strategy planning system

C.-W. Wu and C.-C. Wei

Proc. SEMICON Taiwan 97, Test Seminar, pp.87-92

09/1997

Abstract

economic;VLSI

Computer Science;Semiconductor

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Title: The economic models for a VLSI test strategy planning system
Creators - without role: C.-W. Wu
C.-C. Wei
Publication Details: Proc. SEMICON Taiwan 97, Test Seminar, pp.87-92
Identifiers: 9957766812606774
Academic Unit: College of Electrical Engineering and Computer Science, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Conference paper