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The effect of indium tin oxide as an ohmic contact for the 850 nm GaAs oxide-confined VCSELs
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The effect of indium tin oxide as an ohmic contact for the 850 nm GaAs oxide-confined VCSELs

Wen-Jang Jiang, Meng-Chyi Wu, Hsin-Chieh Yu, Chun-Yuan Huang, Chia-Pin Sung and Jim-Yong Chi
Solid-State Electronics, Vol.46(11), pp.1945-1948
11/2002

Abstract

Indium tin oxide Vertical-cavity surface-emitting lasers
In this article, we report the effect of indium tin oxide (ITO) as a p-type ohmic contact for the 850 nm GaAs oxide-confined vertical-cavity surface-emitting lasers (VCSELs). The VCSELs with ITO contact have a threshold current of 0.96 mA, a full-width-at-half-maximum angle of beam divergence of 27° and an ellipticity of 103.8% for the far-field pattern at a 10-mA driving current, which are the same as those of the conventional VCSELs with Au/Zn/Au or Ti/Pt/Au ohmic contacts. In addition, the VCSELs with ITO contact exhibit a light output power of 1.27 times in magnitude higher than those of the conventional VCSELs. © 2002 Elsevier Science Ltd. All rights reserved.

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